Contents

• List of Figures
• List of Tables
• 1. Introduction
• 2. Software
  • 2.1 CALDB
  • 2.2 XSELECT
  • 2.3 XANADU
  • 2.4 Profit
  
  
• 3. Suzaku Data Specifics and Conventions
  • 3.1 Directory and Data File Structure
    • 3.1.1 Retrieving the Data
    • 3.1.2 Data Organization
  • 3.2 Filenames
  • 3.3 Suzaku Coordinates
  • 3.4 Photon Energies and Pulse Heights
  • 3.5 Timing Information
  • 3.6 Suzaku Telemetry
    • 3.6.1 Data Rates
    • 3.6.2 Allocations
    • 3.6.3 Telemetry Limits
  • 3.7 XSELECT Default Parameters
  
  
• 4. Suzaku Data Analysis Overview
  • 4.1 Important Events and Processing Version
  • 4.2 Checking for Updates
  • 4.3 Unfiltered or Cleaned?
  • 4.4 Barycentric Correction
  • 4.5 Spectral Analysis
  • 4.6 Timing Analysis
  • 4.7 Imaging Analysis
  • 4.8 Recipe 1: XIS Spectral Analysis
  • 4.9 Recipe 2: HXD Spectral Analysis
  
  
• 5. ``README FIRST" for the Suzaku Data Analysis
  • 5.1 Introduction
  • 5.2 On-board Changes
    • 5.2.1 XIS2 Loss
    • 5.2.2 XIS0 Anomaly
    • 5.2.3 XIS1 Anomaly
    • 5.2.4 Additional Optical Blocking Filter Holes in XIS1 and XIS3
    • 5.2.5 XIS Spaced-Row Charge Injection (SCI)
    • 5.2.6 XIS1 Change to CI6keV in 2010/11
    • 5.2.7 PIN Epochs: Low Energy Threshold & Responses
    • 5.2.8 Additional Attitude Wobble
  • 5.3 XIS Software Tools, Recipes
    • 5.3.1 Reprocessing and Screening: Aepipeline
    • 5.3.2 Cleansis Runaway Problem
    • 5.3.3 Improved Attitude Correction and Pile-Up Estimation
    • 5.3.4 Exposure Maps, Vignetting Correction
    • 5.3.5 A faster ARF Generator than Xissimarfgen: Xisarfgen
    • 5.3.6 XIS Non X-Ray Background Estimation
    • 5.3.7 Estimation & Mitigation of XIS1 NXB Increase with CI6keV
    • 5.3.8 XIS Burst Option Exposure Times
    • 5.3.9 Timing Mode
  • 5.4 HXD Software Tools, Recipes
    • 5.4.1 Reprocessing and Screening: Aepipeline
    • 5.4.2 HXD Spectra and Lightcurves: Extraction Tools
  • 5.5 XIS Calibration Updates
    • 5.5.1 Contamination Model
    • 5.5.2 XIS Reprocessing History
    • 5.5.3 Energy Scale for SCI Data
    • 5.5.4 Energy Scale for SCI-Off Data of 2006
    • 5.5.5 Energy Scale for Window Option Data
    • 5.5.6 Energy Scale for Editing Mode Data
    • 5.5.7 Energy Scale Calibration Files Ae_xi0,3_makepi_20111227.fits wrong
    • 5.5.8 XIS NXB Calibration Files Ae_xi*_nxb*_20121201.fits wrong
    • 5.5.9 Calibration Uncertainties near 2keV
    • 5.5.10 Calibration Uncertainties at low Energies for highly absorbed Sources
    • 5.5.11 XRT/XIS Effective Area
  • 5.6 HXD Calibration Updates
    • 5.6.1 PIN Noise & Energy Range
    • 5.6.2 GSO Gain Calibration
  • 5.7 Cross Calibration
    • 5.7.1 Flux Cross Calibration: XIS0,1,3
    • 5.7.2 Flux Cross Calibration: XIS and HXD
    • 5.7.3 Flux and Spectral Shape Cross Calibration: Multi-Mission
  
  
• 6. XIS Data Analysis
  • 6.1 Introduction
  • 6.2 Cleaned Event File Content
  • 6.3 Energy Scale Reprocessing (Xispi) and Screening using Xisrepro
  • 6.4 Full XIS Reprocessing and Screening using Aepipeline
  • 6.5 Extracting Products
    • 6.5.1 Combining 3x3 and 5x5 Editing Mode Data
    • 6.5.2 Additional Screening
    • 6.5.3 Relaxing Screening Criteria
    • 6.5.4 Region Selection
    • 6.5.5 Calibration Source Locations
    • 6.5.6 BACKSCAL
  • 6.6 Generating RMF and ARF Files
    • 6.6.1 Rebinning XIS Spectra Generating Responses using Xisresp
    • 6.6.2 Combining Spectra and Responses using addascaspec
    • 6.6.3 Generating RMF Files using Xisrmfgen
    • 6.6.4 Generating ARF Files using Xissimarfgen (or Xisarfgen)
    • 6.6.5 Faster Fitting of XIS Spectra
  • 6.7 Pile-Up
  • 6.8 XIS Non X-Ray Background
    • 6.8.1 Xisnxbgen
  • 6.9 Creating an Exposure Map
    • 6.9.1 Types of Exposure Maps
    • 6.9.2 Running Xissim
    • 6.9.3 Extracting a Flat Field Image
    • 6.9.4 Smoothing the Flat Field Image
    • 6.9.5 Trimming the Flat Field Image
    • 6.9.6 Applying the Flat Field Image
  • 6.10 Initial Processing: Details
    • 6.10.1 Assigning Arrival Times
    • 6.10.2 Calculating Sky Coordinates
    • 6.10.3 Put Pixel Quality
    • 6.10.4 Computing PI Energy Channels
  • 6.11 Standard Screening
    • 6.11.1 Bad Pixel Filtering
    • 6.11.2 Grade Filters
  
  
• 7. HXD Data Analysis
  • 7.1 Introduction
  • 7.2 Cleaned Event File Content
  • 7.3 HXD Reprocessing and Screening: General Remarks
  • 7.4 Full HXD Reprocessing and Screening using Aepipeline
  • 7.5 PIN Spectral Analysis
    • 7.5.1 PIN Non X-Ray Background
    • 7.5.2 PIN Spectral Extraction
    • 7.5.3 PIN Responses by Epoch
    • 7.5.4 Cosmic X-Ray Background
    • 7.5.5 Systematic PIN NXB Background Uncertainties
    • 7.5.6 Hxdpinxbpi
  • 7.6 GSO Data Analysis: General Remarks
    • 7.6.1 Revised GSO Gain Calibration: Backward Compatibility
    • 7.6.2 Data Reduction Differences between PIN and GSO
    • 7.6.3 GSO Reprocessing and Screening
  • 7.7 GSO Spectral Analysis
    • 7.7.1 GSO Non X-Ray Background
    • 7.7.2 Hxdgsoxbpi
  • 7.8 Generating HXD ARF Files using hxdarfgen
  • 7.9 PIN Timing Analysis
    • 7.9.1 Hxdpinxblc
  • 7.10 GSO Timing Analysis
    • 7.10.1 Hxdgsoxblc
  • 7.11 Initial Processing: Details
    • 7.11.1 Time Assignment
    • 7.11.2 Gain History Generation
    • 7.11.3 Pulse Height Corrections
    • 7.11.4 Calculating Event Grade
  • 7.12 Extracting Data
    • 7.12.1 Standard and Additional Screening
    • 7.12.2 Separating PIN and GSO Data
  • 7.13 WAM Data Analysis
    • 7.13.1 Introduction
    • 7.13.2 WAM Event File Content
    • 7.13.3 WAM HEAsoft Tools
    • 7.13.4 WAM Timing Analysis
    • 7.13.5 WAM Spectral Analysis
    • 7.13.6 Standard Processing
    • 7.13.7 Useful WAM Websites
    • 7.13.8 Contact
  
  
• A. Acronyms
• B. Important Web/E-mail Addresses